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1

Reliability of ultrathin gate oxides for ULSI devices

Chun-Yen Chang, Chi-Chun Chen, Horng-Chih Lin, Mong-Song Liang, Chao-Hsin Chien, Tiao-Yuan Huang

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 251 KB

english, 1999

2

100-nm IGZO Thin-Film Transistors With Film Profile Engineering

Lin, Horng-Chih, Shie, Bo-Shiuan, Huang, Tiao-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 836 KB

english, 2014

3

High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts

Yao-Jen Lee, Tien-Sheng Chao, Tiao-Yuan Huang

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 193 KB

english, 2005

4

Effects of O2 plasma treatment on the electric and dielectric characteristics of Ba0.7Sr0.3TiO3 thin films

Ching-Chich Leu, Shih-Hsiung Chan, Haur-Ywh Chen, Ray-Hua Horng, Dong-Sing Wuu, Luh-Huei Wu, Tiao-Yuan Huang, Chun-Yen Chang, Simon Min Sze

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 200 KB

english, 2000

5

Latchup performance of retrograde and conventional n-well CMOS technologies

Lewis, A.G., Martin, R.A., Tiao-Yuan Huang, Chen, J.Y., Koyanagi, M.

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 973 KB

english, 1987

6

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - Stability of InGaZnO thin-film transistors with Durimide passivation

Bo-Shiuan Shie,, Chih-Bin Chang,, Hao-Chun Chang,, Horng-Chih Lin,, Tiao-Yuan Huang,

Year:

2015

Language:

english

File:

PDF, 419 KB

english, 2015

7

[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Film-profile-engineered IGZO thin-film transistors with gate/drain offset for high voltage operation

Wu, Ming-Hung, Lin, Horng-Chih, Li, Pei-Wen, Huang, Tiao-Yuan

Year:

2016

Language:

english

File:

PDF, 1.22 MB

english, 2016

8

A simple method for sub-100 nm pattern generation with I-line double-patterning technique

Tzu-I Tsai, Horng-Chih Lin, Min-Feng Jian, Tiao-Yuan Huang, Tien-Sheng Chao

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 537 KB

english, 2010

9

Novel poly-silicon nanowire field effect transistor for biosensing application

Cheng-Yun Hsiao, Chih-Heng Lin, Cheng-Hsiung Hung, Chun-Jung Su, Yen-Ren Lo, Cheng-Che Lee, Horng-Chin Lin, Fu-Hsiang Ko, Tiao-Yuan Huang, Yuh-Shyong Yang

Journal:

Biosensors and Bioelectronics

Year:

2009

Language:

english

File:

PDF, 1.05 MB

english, 2009

10

Impacts of a buffer layer and hydrogen-annealed wafers on the performance of strained-channel nMOSFETs with SiN-capping layer

Tzu-I Tsai, Horng-Chih Lin, Yao-Jen Lee, King-Sheng Chen, Jeff Wang, Fu-Kuo Hsueh, Tien-Sheng Chao, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 618 KB

english, 2008

11

RF CMOS technology for MMIC

Chun-Yen Chang, Jiong-Guang Su, Shyh-Chyi Wong, Tiao-Yuan Huang, Yuan-Chen Sun

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 1014 KB

english, 2002

12

Impacts of SiN deposition parameters on n-channel metal-oxide-semiconductor field-effect-transistors

Ching-Sen Lu, Horng-Chih Lin, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 319 KB

english, 2008

13

A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO2/poly-gate complementary metal oxide semiconductor technology

Wu-Te Weng, Yao-Jen Lee, Horng-Chih Lin, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.34 MB

english, 2010

14

Plasma-induced charging damage in ultrathin (3-nm) gate oxides

Chi-Chun Chen, Horng-Chih Lin, Chun-Yen Chang, Mong-Song Liang, Chao-Hsin Chien, Szu-Kang Hsien, Tiao-Yuan Huang, Tien-Sheng Chao

Journal:

IEEE Transactions on Electron Devices

Year:

2000

Language:

english

File:

PDF, 153 KB

english, 2000

15

high-performance and high-reliability 80-nm gate-length DTMOS with indium super steep retrograde channel

Sun-Jay Chang, Chun-Yen Chang, Coming Chen, Tien-Sheng Chao, Yao-Jen Lee, Tiao-Yuan Huang

Journal:

IEEE Transactions on Electron Devices

Year:

2000

Language:

english

File:

PDF, 163 KB

english, 2000

16

Characterizations of polycrystalline silicon nanowire thin-film transistors enhanced by metal-induced lateral crystallization

Su, Chun-Jung, Huang, Yu-Feng, Lin, Horng-Chih, Huang, Tiao-Yuan

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.03 MB

english, 2012

17

Performance Enhancement in Double-Gated Poly-Si Nanowire Transistors With Reduced Nanowire Channel Thickness

Horng-Chih Lin,, Wei-Chen Chen,, Chuan-Ding Lin,, Tiao-Yuan Huang,

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 489 KB

english, 2009

18

Performance Improvement in RF LDMOS Transistors Using Wider Drain Contact

Chen, Kun-Ming, Chen, Bo-Yuan, Chiu, Chia-Sung, Huang, Guo-Wei, Chen, Chun-Hao, Lin, Horng-Chih, Huang, Tiao-Yuan, Chen, Ming-Yi, Yang, Yu-Chi, Jaw, Brenda, Wang, Kai-Li

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 480 KB

english, 2013

19

Fabrication of High-Performance ZnO Thin-Film Transistors With Submicrometer Channel Length

Lin, Horng-Chih, Lyu, Rong-Jhe, Huang, Tiao-Yuan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 521 KB

english, 2013

20

[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - ESD reliability impact of p+ pocket implant on double implanted NLDD MOSFET

Consiglio, R., Tiao Yuan Huang,

Year:

1995

Language:

english

File:

PDF, 312 KB

english, 1995

21

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - A Comprehensive Model for Plasma Damage Enhanced Transistor Reliability Degradation

Weng, W. T., Oates, A. S., Huang, Tiao-Yuan

Year:

2007

Language:

english

File:

PDF, 456 KB

english, 2007

22

Study of the Gate-Sensing and Channel-Sensing Transient Analysis Method for Monitoring the Charge Vertical Location of SONOS-Type Devices

Pei-Ying Du,, Hang-Ting Lue,, Szu-Yu Wang,, Erh-Kun Lai,, Tiao-Yuan Huang,, Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,, Pei-Ying Du,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 1.59 MB

english, 2007

23

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Film profile engineering (FPE): A new concept for manufacturing of short-channel metal oxide TFTs

Lyu, Rong-Jhe, Lin, Horng-Chih, Wu, Ming-Hung, Shie, Bo-Shiuan, Hung, Hsiang-Ting, Huang, Tiao-Yuan

Year:

2013

Language:

english

File:

PDF, 997 KB

english, 2013

24

Improved immunity to plasma damage in ultrathin nitrided oxides [CMOS technology]

Chi-Chun Chen,, Horng-Chih Lin,, Chun-Yen Chang,, Mong-Song Liang,, Chao-Hsin Chien,, Szu-Kang Hsien,, Tiao-Yuan Huang,

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 65 KB

english, 2000

25

A novel sacrificial gate stack process for suppression of boron penetration in p-MOSFET with shallow BF/sub 2/-implanted source/drain extension

Sun-Jay Chang,, Chun-Yen Chang,, Tien-Sheng Chao,, Sheng-Zhen Zhong,, Wen-Kuan Yeh,, Tiao-Yuan Huang,

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 58 KB

english, 2000

26

Submicron organic thin-film transistors fabricated by film profile engineering method

Wu, Ming-Hung, Lin, Horng-Chih, Lin, Hung-Cheng, Zan, Hsiao-Wen, Meng, Hsin-Fei, Huang, Tiao-Yuan

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.10 MB

english, 2014

27

The characteristics of hole trapping in HfO[sub 2]∕SiO[sub 2] gate dielectrics with TiN gate electrode

Lu, Wen-Tai, Lin, Po-Ching, Huang, Tiao-Yuan, Chien, Chao-Hsin, Yang, Ming-Jui, Huang, Ing-Jyi, Lehnen, Peer

Journal:

Applied Physics Letters

Year:

2004

Language:

english

File:

PDF, 246 KB

english, 2004

28

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Improved Hot Carrier Reliability in Strained-Channel NMOSFETS with TEOS Buffer Layer

Lu, Ching-Sen, Lin, Homg-Chih, Lee, Yao-Jen, Huang, Tiao-Yuan

Year:

2007

Language:

english

File:

PDF, 2.20 MB

english, 2007

29

The Effects of Shallow Germanium Halo Doping on N-Channel Metal Oxide Semiconductor Field Effect Transistors

Wang, Meng-Fan, Chien, Chao-Hsin, Chao, Tien-Sheng, Lin, Horng-Chih, Jong, Fuh-Cheng, Huang, Tiao-Yuan, Chang, Chun-Yen

Journal:

Japanese Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 236 KB

english, 1999

30

Dimensional Effects on the Drain Current of N- and P-Channel Polycrystalline Silicon Thin Film Transistors

Shih, Po-Sheng, Zan, Hsiao-Wen, Chang, Ting-Chang, Huang, Tiao-Yuan, Chang, Chun-Yen

Journal:

Japanese Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 91 KB

english, 2000

31

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Advances in Resist Technology and Processing XVII - Film characterization and evaluation of process performance for the modified electron beam resist

Ko, Fu-Hsiang, Ting, Jyh-Hua, Chou, Cheng-Tung, Hsiao, Li-Tung, Huang, Tiao-Yuan, Dai, Bau-Tong, Houlihan, Francis M.

Year:

2000

Language:

english

File:

PDF, 684 KB

english, 2000

32

Resolution enhancement of digital laser scanning fluorescence microscopy with a dual-lens optical pickup head

Tsai, Rung-Ywan, Chen, Jung-Po, Lee, Yuan-Chin, Chiang, Hung-Chih, Huang, Tai-Ting, Huang, Chun-Chieh, Cheng, Chih-Ming, Cheng, Chung-Ta, Lo, Feng-Hsiang, Tiao, Golden

Journal:

Year:

2016

Language:

english

File:

PDF, 3.49 MB

english, 2016

33

Microscopic and Submicroscopic Gradient Variation of Olfactory Systems among Six Sinocyclocheilus Species Living in Different Environments

Zhang, Xiao-Yan, Huang, Zhu-Qin, Ning, Tiao, Xiang, Xiao-Han, Li, Chun-Qing, Chen, Shan-Yuan, Xiao, Heng

Journal:

Zoological Science

Year:

2018

Language:

english

File:

PDF, 2.78 MB

english, 2018

34

An improved approach for small-signal equivalent-circuit parameter determination of InGaP/GaAs HBT

Han-Yu Chen, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang, Tiao-Yuan Huang

Journal:

Microwave and Optical Technology Letters

Year:

2005

Language:

english

File:

PDF, 128 KB

english, 2005

35

A carbon nanotube field effect transistor with tunable conduction-type by electrostatic effects

Bae-Horng Chen, Jeng-Hua Wei, Po-Yuan Lo, Hung-Hsiang Wang, Ming-Jinn Lai, Ming-Jinn Tsai, Tien Sheng Chao, Horng-Chih Lin, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 1.44 MB

english, 2006

36

The extraction of MOSFET gate capacitance from S-parameter measurements

Jiong-Guang Su, Shyh-Chih Wong, Chun-Yen Chang, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 264 KB

english, 2002

37

Ambipolar Schottky barrier silicon-on-insulator metal–oxide–semiconductor transistors

Horng-Chih Lin, Meng-Fan Wang, Chia-Yu Lu, Tiao-Yuan Huang

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 319 KB

english, 2003

38

Simultaneous etching of polysilicon materials with different doping types by low-damage transformer-coupled plasma technique

Chi-Chao Hung, Horng-Chih Lin, Meng-Fan Wang, Tiao-Yuan Huang, Han-Chang Shih

Journal:

Microelectronic Engineering

Year:

2002

Language:

english

File:

PDF, 730 KB

english, 2002

39

An anomalous crossover in Vth roll-off for indium-doped nMOSFETs

Sun-Jay Chang, Chun-Yen Chang, Coming Chen, Jih-Wen Chou, Tien-Sheng Chao, Tiao-Yuan Huang

Journal:

IEEE Electron Device Letters

Year:

2000

Language:

english

File:

PDF, 50 KB

english, 2000

40

Ultrasensitive detection of dopamine using a polysilicon nanowire field-effect transistor

Lin, Chih-Heng, Hsiao, Cheng-Yun, Hung, Cheng-Hsiung, Lo, Yen-Ren, Lee, Cheng-Che, Su, Chun-Jung, Lin, Horng-Chin, Ko, Fu-Hsiang, Huang, Tiao-Yuan, Yang, Yuh-Shyong

Journal:

Chemical Communications

Year:

2008

Language:

english

File:

PDF, 662 KB

english, 2008

41

High-voltage and high-temperature applications of DTMOS with reverse Schottky barrier on substrate contacts

Tien-Sheng Chao, Yao-Jen Lee, Tiao-Yuan Huang

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 179 KB

english, 2004

42

Electrical properties of metal–ferroelectric–insulator–semiconductor using sol–gel derived SrBi2Ta2O9 film and ultra-thin Si3N4 buffer layer

Chia-Hsing Huang, Tseung-Yuen Tseng, Chao-Hsin Chien, Ming-Jui Yang, Ching-Chich Leu, Ting-Chang Chang, Po-Tsun Liu, Tiao-Yuan Huang

Journal:

Thin Solid Films

Year:

2002

Language:

english

File:

PDF, 972 KB

english, 2002

43

The effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistor

Chun-Yen Chang, Yeong-Shyang Lee, Tiao-Yuan Huang, Po-Sheng Shih, Chiung-Wei Lin

Journal:

Materials Chemistry and Physics

Year:

2000

Language:

english

File:

PDF, 211 KB

english, 2000

44

Characterisation of a suspended nanowire channel thin-film transistor with sub-100 nm air gap

Chia-Hao Kuo, Chia-Wei Hsu, Horng-Chih Lin, Tiao-Yuan Huang

Journal:

Micro & Nano Letters

Year:

2011

Language:

english

File:

PDF, 330 KB

english, 2011

45

Improved low temperature characteristics of P-channel MOSFETs with Si1-xGex raised source and drain

Hsiang-Jen Huang, Kun-Ming Chen, Tiao-Yuan Huang, Tien-Sheng Chao, Guo-Wei Huang, Chao-Hsin Chien, Chun-Yen Chang

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 166 KB

english, 2001

46

Ambipolar Schottky-barrier TFTs

Horng-Chih Lin, Kuan-Lin Yeh, Tiao-Yuan Huang, Ruo-Gu Huang, Sze, S.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 161 KB

english, 2002

47

In situ POCl3-doped interlevel oxidation

Tiao-Yuan Huang, Paterson, J.

Journal:

IEEE Transactions on Electron Devices

Year:

1985

Language:

english

File:

PDF, 334 KB

english, 1985

48

Hot-electron-induced punchthrough (HEIP) effect in submicrometer PMOSFET's

Koyanagi, M., Lewis, A.G., Martin, R.A., Tiao-Yuan Huang, Chen, J.Y.

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 765 KB

english, 1987

49

Device isolation in high-density LOCOS-isolated CMOS

Lewis, A.G., Chen, J.Y., Martin, R.A., Tiao-Yuan Huang

Journal:

IEEE Transactions on Electron Devices

Year:

1987

Language:

english

File:

PDF, 1.01 MB

english, 1987

50

Fabrication and Characterization of Multiple-Gated Poly-Si Nanowire Thin-Film Transistors and Impacts of Multiple-Gate Structures on Device Fluctuations

Hsing-Hui Hsu, Ta-Wei Liu, Leng Chan, Chuan-Ding Lin, Tiao-Yuan Huang, Horng-Chih Lin

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 1.47 MB

english, 2008

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